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1

Soft Failures in Large Datacenters

Sankar, Sriram, Gurumurthi, Sudhanva

Journal:

IEEE Computer Architecture Letters

Year:

2014

Language:

english

File:

PDF, 3.05 MB

english, 2014

2

Using Intradisk Parallelism to Build Energy-Efficient Storage Systems

Gurumurthi, S., Stan, M.R., Sankar, S.

Journal:

Year:

2009

Language:

english

File:

PDF, 618 KB

english, 2009

3

Sensitivity-Based Optimization of Disk Architecture

Sankar, S., Yan Zhang, Gurumurthi, S., Stan, M.R.

Journal:

IEEE Transactions on Computers

Year:

2009

Language:

english

File:

PDF, 2.87 MB

english, 2009

4

[IEEE 2009 IEEE International Test Conference (ITC) - Austin, TX, USA (2009.11.1-2009.11.6)] 2009 International Test Conference - Cache-resident self-testing for I/O circuitry

Gurumurthy, Sankar, Bertanzetti, Darren, Jakobsen, Peter, Rearick, Jeff

Year:

2009

Language:

english

File:

PDF, 290 KB

english, 2009

5

[IEEE Telecommunication Systems (MASCOTS) - Baltimore, MD, USA (2008.09.8-2008.09.10)] 2008 IEEE International Symposium on Modeling, Analysis and Simulation of Computers and Telecommunication Systems - Sensitivity Based Power Management of Enterprise Storage Systems

Sankar, Sriram, Gurumurthi, Sudhanva, Stan, Mircea R.

Year:

2008

Language:

english

File:

PDF, 5.30 MB

english, 2008

6

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Automatic generation of instruction sequences targeting hard-to-detect structural faults in a processor

Gurumurthy, Sankar, Vasudevan, Shobha, Abraham, Jacob

Year:

2006

Language:

english

File:

PDF, 131 KB

english, 2006

7

[IEEE 2008 35th International Symposium on Computer Architecture (ISCA) - Beijing, China (2008.06.21-2008.06.25)] 2008 International Symposium on Computer Architecture - Intra-disk Parallelism: An Idea Whose Time Has Come

Sankar, Sriram, Gurumurthi, Sudhanva, Stan, Mircea R.

Year:

2008

Language:

english

File:

PDF, 518 KB

english, 2008

8

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - ACCE: Automatic correction of control-flow errors

Vemu, Ramtilak, Gurumurthy, Sankar, Abraham, Jacob A.

Year:

2007

Language:

english

File:

PDF, 187 KB

english, 2007

9

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Automatic Generation of Instructions to Robustly Test Delay Defects in Processors

Gurumurthy, Sankar, Vemu, Ramtilak, Abraham, Jacob A., Saab, Daniel G.

Year:

2007

Language:

english

File:

PDF, 143 KB

english, 2007

10

[IEEE 2009 10th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2009.03.16-2009.03.18)] 2009 10th International Symposium on Quality of Electronic Design - Functionally valid gate-level peak power estimation for processors

Sambamurthy, Sriram, Gurumurthy, Sankar, Vemu, Ramtilak, Abraham, Jacob A.

Year:

2009

Language:

english

File:

PDF, 156 KB

english, 2009

11

[ACM Press the 18th ACM Great Lakes symposium - Orlando, Florida, USA (2008.05.04-2008.05.06)] Proceedings of the 18th ACM Great Lakes symposium on VLSI - GLSVLSI '08 - On efficient generation of instruction sequences to test for delay defects in a processor

Gurumurthy, Sankar, Vemu, Ramtilak, Abraham, Jacob A., Natarajan, Suriyaprakash

Year:

2008

Language:

english

File:

PDF, 175 KB

english, 2008

12

Datacenter Scale Evaluation of the Impact of Temperature on Hard Disk Drive Failures

Sankar, Sriram, Shaw, Mark, Vaid, Kushagra, Gurumurthi, Sudhanva

Journal:

ACM Transactions on Storage

Year:

2013

Language:

english

File:

PDF, 926 KB

english, 2013

13

[ACM Press the 11th ACM Conference - Cagliari, Italy (2014.05.20-2014.05.22)] Proceedings of the 11th ACM Conference on Computing Frontiers - CF '14 - Power availability provisioning in large data centers

Sankar, Sriram, Gauthier, David, Gurumurthi, Sudhanva

Year:

2014

Language:

english

File:

PDF, 355 KB

english, 2014

14

[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Comparing the effectiveness of cache-resident tests against cycleaccurate deterministic functional patterns

Gurumurthy, Sankar, Pratapgarhwala, Mustansir, Gilgan, Curtis, Rearick, Jeff

Year:

2014

Language:

english

File:

PDF, 1.05 MB

english, 2014

15

Intra-disk Parallelism

Sankar, Sriram, Gurumurthi, Sudhanva, Stan, Mircea R.

Journal:

ACM SIGARCH Computer Architecture News

Year:

2008

Language:

english

File:

PDF, 515 KB

english, 2008